Skip to main content Skip to main navigation menu Skip to site footer

Уважаемые пользователи! На нашем хостинге ведутся технические работы, на сайте могут быть ошибки. Приносим свои извинения за временные неудобства.

Bulletin of the Abai KazNPU, the series of "Physical and Mathematical Sciences"
Make a new submission
Vol. 72 No. 4 (2020)

ADAPTATION OF THE SMM-2000 INSTALLATION TO STUDENTS SCIENTIFIC WORKS ON STUDYING THE SURFACE OF VARIOUS MATERIALS

Published December 2020
D.M. Nassirova +− М.М. Myrzatay +− А. Ussenova +− B. Nurakhmet +−
Abai Kazakh National Pedagogical University, Almaty
Abai Kazakh National Pedagogical University, Almaty
Abai Kazakh National Pedagogical University, Almaty
Abai Kazakh National Pedagogical University, Almaty
DOI: 10.51889/2020-4.1728-7901.22
Abstract

This paper presents the capabilities of the device "Scanning multi-microscope SMM-2000" as one of the most modern methods for measuring the characteristics of materials and diagnostics of features of small-size systems. The SMM-2000 scanning multi-microscope is designed for measuring geometric and physical parameters of the surface topography of samples with nanometer spatial resolution. The principle of operation of the device is briefly described and the parameters of manual and automatic settings are presented. On the example of scanning sample No. 2 - gold on mica, graphical results are shown that show sectional analysis for the selected area of the frame, and the results of the surface roughness parameters of the selected area are also shown. Described the possibility of carrying out Fourier analysis, morphological analysis, correlation analysis, fractal analysis, etc.

pdf (Рус)
Language

Рус

Keywords
sample AFM mode fractal surface analysis surface roughness analysis
How to Cite

[1]
Насирова, Д. , Мырзатай, М., Усенова , .А. and Нұрахмет , Б. 2020. ADAPTATION OF THE SMM-2000 INSTALLATION TO STUDENTS SCIENTIFIC WORKS ON STUDYING THE SURFACE OF VARIOUS MATERIALS . Bulletin of the Abai KazNPU, the series of "Physical and Mathematical Sciences". 72, 4 (Dec. 2020), 143–148. DOI:https://doi.org/10.51889/2020-4.1728-7901.22.